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A Fortnightly Journal of Research
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Special Section
Surface Characterization using Accelerators (Guest Editors: D. K Avasthi and N. C. Mishra)
Volume 80, Issue 12
25 June, 2001
p. 1472-1602
Preface
p. 1531 |
Mehta, G. K.
ERDA with swift heavy ions for materials characterization
p. 1532 |
Avasthi, D. K.
;
Assmann, W.
Proton Induced X-ray Emission - A tool for non-destructive trace element analysis
p. 1542 |
Govil, I. M.
Surface and near-surface modifications and analysis by MeV ions
p. 1550 |
Dev, B. N.
Swift heavy ion-induced modification and track formation in materials
p. 1560 |
Kanjilal, D.
Irradiation effects of swift heavy ions on gallium arsenide, silicon and silicon diodes
p. 1567 |
Bhoraskar, V. N.
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