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Surface Characterization (Guest Editor: M. K. Sanyal)
Volume 78, Issue 12
25 June, 2000
p. 1404-1576

Progress in scanning probe microscopy: High resolution force microscopy and spectroscopy
p. 1445 | Erlandsson, R.; Apell, Peter
Neutron scattering for surface characterization
p. 1458 | Penfold, J.
X-ray reflectivity and diffuse scattering
p. 1467 | Gibaud, A.; Hazra, S.
Grazing incidence X-Ray diffraction
p. 1478 | Dutta, Pulak
Investigations of semiconductor surfaces and interfaces by X-ray grazing incidence diffraction
p. 1484 | Pietsch, Ullrich
X-ray scattering at liquid surfaces and interfaces
p. 1496 | Daillant, Jean
Surface physics at Saha Institute
p. 1507 | Banerjee, S.; Bhattacharyya, S. R.; Chakraborty, P.; Datta, A.; Ghose, D.; Kundu, S.; Sanyal, M. K.
Aspects of surface and interface characterizations by X-rays: The research programme at IOP, Bhubaneswar
p. 1511 | Dev, B. N.
Surface and interface studies at IUC-DAEF, Indore
p. 1515 | Dasannacharya, B. A.; Gupta, Ajay; Chaudhari, S. M.; Ganesan, V.; Shripathi, T.
Twenty years of surface science in the Department of Physics, University of Pune
p. 1519 | Kulkarni, S. K.
Surface analytical facility at NPL, New Delhi
p. 1523 | Chakraborty, B. R.; Mohan, Pardeep; Shivaprasad, S. M.; Sharma, D. R.; Anandan, C.; Gupta, A. C.; Raychaudhuri, A. K.
Surface characterization of thin film devices and optical elements
p. 1528 | Sahoo, N. K.; Bhattacharyya, D.; Thakur, S.; Udupa, Dinesh; Shukla, R. P.; Das, N. C.; Roy, A. P.

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